首页> 外国专利> ELECTRON BEAM SPECTROMETER USING AN FOCUS TYPE ELECTRON PATH BENDING MAGNET ACCORDING TO AN ELECTRON BEAM ENERGY DISTRIBUTION, CAPABLE OF ACCURATELY MEASURING THE ENERGY OF AN ELECTRON BEAM

ELECTRON BEAM SPECTROMETER USING AN FOCUS TYPE ELECTRON PATH BENDING MAGNET ACCORDING TO AN ELECTRON BEAM ENERGY DISTRIBUTION, CAPABLE OF ACCURATELY MEASURING THE ENERGY OF AN ELECTRON BEAM

机译:使用根据电子束能量分布的聚焦型电子路径弯曲磁体的电子束光谱仪,可以精确地测量电子束的能量

摘要

PURPOSE: An electron beam spectrometer using an focus type electron path bending magnet according to an electron beam energy distribution is provided to selectively use an electron beam of an energy band by focusing and separating electrons on a specific point from the electron beam according to the energy band.;CONSTITUTION: An electronic beam is inputted between two triangular magnets(2). An electronic beam spectrometer forms a focus path according to energy. A first photosensitive film(3) measures the divergence of the electron beam inputted before using two triangular magnets. A second photosensitive film(4) measures the corresponding position of the electron beam focused on a specific point according to the energy by passing through two triangular magnets.;COPYRIGHT KIPO 2010
机译:目的:提供一种根据电子束能量分布使用聚焦型电子路径弯曲磁体的电子束光谱仪,通过根据能量将电子上的特定点聚焦并从电子束中分离出来,从而选择性地使用能带中的电子束组成:一个电子束被输入到两个三角形磁铁(2)之间。电子束光谱仪根据能量形成聚焦路径。第一光敏膜(3)测量在使用两个三角形磁体之前输入的电子束的发散。第二个感光膜(4)通过穿过两个三角形磁铁,根据能量测量聚焦在特定点上的电子束的相应位置。; COPYRIGHT KIPO 2010

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