首页> 外国专利> METHOD FOR CORRECTING OPTICAL PROXIMITY EFFECT, CAPABLE OF INCREASING THE ACCURACY OF A TWO DIMENSIONAL CONTACT HOLE

METHOD FOR CORRECTING OPTICAL PROXIMITY EFFECT, CAPABLE OF INCREASING THE ACCURACY OF A TWO DIMENSIONAL CONTACT HOLE

机译:能够提高二维接触孔精度的光学邻近效应的校正方法

摘要

PURPOSE: A method for correcting optical proximity effect is provided to reduce time required for correcting the optical proximity effect by rapidly and accurately calculating OPC biases.;CONSTITUTION: An OPC layer(110) sets offsets(E, F, G, H) with respect to a target layer(100). Based on the offsets, complete OPC biases(I, J, K, L) are set. Time which is required for setting the complete OPC biases is reduced by setting the offsets. The offsets are set before the complete OPS biases are set in order to improve the accuracy of optical proximity effect correction.;COPYRIGHT KIPO 2011
机译:目的:提供一种校正光学邻近效应的方法,以通过快速,准确地计算OPC偏差来减少校正光学邻近效应所需的时间。组成:OPC层(110)设置偏移量(E,F,G,H)相对于目标层(100)。基于偏移量,设置完整的OPC偏置(I,J,K,L)。通过设置偏移量可以减少设置完整OPC偏置所需的时间。在设置完整的OPS偏置之前先设置偏移,以提高光学邻近效应校正的准确性。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110001133A

    专利类型

  • 公开/公告日2011-01-06

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090058534

  • 发明设计人 LEE DONG JIN;

    申请日2009-06-29

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 17:52:48

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