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MANUFACTURING METHOD ONE TIME PROGRAMMABLE MEMORY DEVICE AND MEMORY CELL STRUCTURE THEREOF

机译:一种一次性可编程存储器装置及其存储器结构的制造方法

摘要

PURPOSE: A method for manufacturing a one time programmable memory and a memory cell structure are provided to stably maintain the performance of an OTP ROM device by decreasing influences on a manufacturing process. CONSTITUTION: Gate electrodes of a select transistor(40) and a memory transistor are formed by patterning a poly silicon layer. An LDD ion is implanted to an active area between the gate electrodes of the memory transistor and the select transistor. A spacer(60) is formed on the sides of the gate electrodes of the memory transistor and the select transistor. A source/drain ion implantation process is performed after a photosensitive pattern which masks the active area is formed. A silicide(70) is formed after the silicide preventing layer is etched by forming the photosensitive pattern.
机译:目的:提供一种用于制造一次性可编程存储器的方法和一种存储单元结构,以通过减少对制造工艺的影响来稳定地维持OTP ROM器件的性能。组成:选择晶体管(40)和存储晶体管的栅极是通过对多晶硅层进行构图而形成的。将LDD离子注入到存储晶体管的栅极和选择晶体管之间的有源区。在存储晶体管和选择晶体管的栅电极的侧面上形成隔离物(60)。在形成掩蔽有源区的光敏图案之后执行源/漏离子注入工艺。在通过形成感光图案蚀刻硅化物防止层之后形成硅化物(70)。

著录项

  • 公开/公告号KR20110024035A

    专利类型

  • 公开/公告日2011-03-09

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20090081879

  • 发明设计人 KIM DAE KYEUN;

    申请日2009-09-01

  • 分类号H01L21/8247;H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-21 17:52:27

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