首页> 外国专利> SLURRY COMPOSITION FOR CHEMICAL MECHANICAL POLISHING CAPABLE OF IMPROVING PROCESS RELIABILITY AND PRODUCTIVITY AND A METHOD FOR PREPARING THE SAME

SLURRY COMPOSITION FOR CHEMICAL MECHANICAL POLISHING CAPABLE OF IMPROVING PROCESS RELIABILITY AND PRODUCTIVITY AND A METHOD FOR PREPARING THE SAME

机译:具有改善工艺可靠性和生产率的化学机械抛光的浆料组合物及其制备方法

摘要

PURPOSE: A slurry composition for chemical mechanical polishing is provided to ensure high polishing rate for a silicon oxide film and to enable the application to a shallow trench isolation process for removing an initial step of a silicon oxide film. ;CONSTITUTION: A slurry composition for chemical mechanical polishing comprises: abrasive particles including cerium oxide particles; one or more additives selected from the group consisting of picolinic acids, propionic acids, and formic acids; and aqueous solution including water. The zeta potential of the abrasive particle surface is 20-70 mV within a range of pH 3-6.;COPYRIGHT KIPO 2011
机译:用途:提供用于化学机械抛光的浆料组合物,以确保对氧化硅膜的高抛光速率,并使得能够应用于浅沟槽隔离工艺以去除氧化硅膜的初始步骤。 ;组成:用于化学机械抛光的浆料组合物,包括:包括氧化铈颗粒的磨料颗粒;和一种或多种选自吡啶甲酸,丙酸和甲酸的添加剂;和水溶液,包括水。在3-6的pH范围内,磨料颗粒表面的zeta电位为20-70 mV。; COPYRIGHT KIPO 2011

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号