首页> 外国专利> THIN FILM TRANSISTOR INCLUDING AN OXIDE SEMICONDUCTOR LAYER AS AN OHMIC CONTACT LAYER AND MANUFACTURING METHOD THEREOF CAPABLE OF IMPLEMENTING A HIGH CONTACT PROPERTY BETWEEN A SOURCE ELECTRODE AND A DRAIN ELECTRODE

THIN FILM TRANSISTOR INCLUDING AN OXIDE SEMICONDUCTOR LAYER AS AN OHMIC CONTACT LAYER AND MANUFACTURING METHOD THEREOF CAPABLE OF IMPLEMENTING A HIGH CONTACT PROPERTY BETWEEN A SOURCE ELECTRODE AND A DRAIN ELECTRODE

机译:包括氧化物半导体层作为欧姆接触层的薄膜晶体管及其制造方法,该方法能够实现源电极和漏电极之间的高接触性能

摘要

PURPOSE: A thin film transistor including an oxide semiconductor layer as an ohmic contact layer and a manufacturing method thereof are provided to prevent a lifting phenomenon between films by forming the ohmic contact layer with a physical deposition method instead of a CVD method.;CONSTITUTION: A gate electrode(130) is formed on a substrate(110). A gate insulation layer(140) is formed on the gate electrode. An active layer(150) is formed on the gate insulation layer. A source electrode(170) and a drain electrode(175) are formed on the gate insulation layer and the active layer. An ohmic contact layer(160) is arranged between the active layer and the source and drain electrodes.;COPYRIGHT KIPO 2011
机译:目的:提供一种包括氧化物半导体层作为欧姆接触层的薄膜晶体管及其制造方法,以通过物理沉积方法代替CVD方法形成欧姆接触层,从而防止薄膜之间的剥离现象。在衬底(110)上形成栅电极(130)。在栅电极上形成栅绝缘层(140)。有源层(150)形成在栅极绝缘层上。在栅绝缘层和有源层上形成源电极(170)和漏电极(175)。欧姆接触层(160)布置在有源层与源极和漏极之间。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110060479A

    专利类型

  • 公开/公告日2011-06-08

    原文格式PDF

  • 申请/专利权人 SAMSUNG MOBILE DISPLAY CO. LTD.;

    申请/专利号KR20090117076

  • 发明设计人 YOU CHUN GI;

    申请日2009-11-30

  • 分类号H01L29/786;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:46

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号