首页> 外国专利> INTERFERENCE SYSTEM AND MEASUREMENT SYSTEM USING PARTIAL REFLECTION CAPABLE OF SIMPLY CONTROLLING THE INTERFERENCE LENGTH OF LIGHT

INTERFERENCE SYSTEM AND MEASUREMENT SYSTEM USING PARTIAL REFLECTION CAPABLE OF SIMPLY CONTROLLING THE INTERFERENCE LENGTH OF LIGHT

机译:利用部分反射能力的干涉系统和测量系统,可以简单地控制光的干涉长度

摘要

PURPOSE: An interference system and a measurement system using partial reflection are provided to measure the phase change of light regardless of the interference length of the light by successively arranging route interference units. ;CONSTITUTION: An interference system using partial reflection comprises a light source unit(10), a first route interference unit(20), and a second route interference unit(30). The light source generates light. The first route interference unit emits light by partially reflecting the generated light. The emitted light is inputted to the second route interference unit. The second route interference unit emits light by partially reflecting the inputted light.;COPYRIGHT KIPO 2011
机译:目的:提供一种干涉系统和一种使用部分反射的测量系统,以通过连续布置路径干涉单元来测量光的相位变化,而与光的干涉长度无关。组成:使用部分反射的干涉系统,包括光源单元(10),第一路径干涉单元(20)和第二路径干涉单元(30)。光源产生光。第一路径干涉单元通过部分反射所产生的光来发光。所发射的光被输入到第二路径干涉单元。第二路径干涉单元通过部分反射输入的光来发光。; COPYRIGHT KIPO 2011

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