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INTERFERENCE SYSTEM AND MEASUREMENT SYSTEM USING PARTIAL REFLECTION CAPABLE OF SIMPLY CONTROLLING THE INTERFERENCE LENGTH OF LIGHT
INTERFERENCE SYSTEM AND MEASUREMENT SYSTEM USING PARTIAL REFLECTION CAPABLE OF SIMPLY CONTROLLING THE INTERFERENCE LENGTH OF LIGHT
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机译:利用部分反射能力的干涉系统和测量系统,可以简单地控制光的干涉长度
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摘要
PURPOSE: An interference system and a measurement system using partial reflection are provided to measure the phase change of light regardless of the interference length of the light by successively arranging route interference units. ;CONSTITUTION: An interference system using partial reflection comprises a light source unit(10), a first route interference unit(20), and a second route interference unit(30). The light source generates light. The first route interference unit emits light by partially reflecting the generated light. The emitted light is inputted to the second route interference unit. The second route interference unit emits light by partially reflecting the inputted light.;COPYRIGHT KIPO 2011
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