首页> 外国专利> WAFER CLEANING DEVICE CAPABLE OF SIMULTANEOUSLY ELIMINATING ORGANIC CONTAMINANTS AND METAL CONTAMINANTS AND A METHOD THEREOF

WAFER CLEANING DEVICE CAPABLE OF SIMULTANEOUSLY ELIMINATING ORGANIC CONTAMINANTS AND METAL CONTAMINANTS AND A METHOD THEREOF

机译:可同时消除有机污染物和金属污染物的晶圆清洗装置及其方法

摘要

PURPOSE: A wafer cleaning device and a method thereof are provided to eliminate an SC(Standard Cleaning)-2 process and a rinse process, thereby simplifying processes. ;CONSTITUTION: A circulation unit circulates cleaning liquid in a cleaning bath. The cleaning bath includes an inner bath(121), a middle bath(122), and an outer bath. An ultrasound wave generating unit(140) increases wafer cleaning efficiency by vibrating cleaning liquid around a wafer. A cleaning liquid supply unit(130) comprises an ultra pure water supply line(131) and a chemical liquid supply line(132). A pump supplies power to cleaning liquid which circulates in circulation pipes.;COPYRIGHT KIPO 2011
机译:目的:提供一种晶片清洁装置及其方法,以消除SC(标准清洁)-2处理和漂洗处理,从而简化了处理。 ;组成:循环单元在清洗槽中循环清洗液。清洁浴包括内部浴(121),中间浴(122)和外部浴。超声波产生单元(140)通过使晶片周围的清洗液振动来提高晶片清洗效率。清洁液供应单元(130)包括超纯水供应管线(131)和化学液体供应管线(132)。泵为循环管道中循环的清洁液提供动力。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110082730A

    专利类型

  • 公开/公告日2011-07-20

    原文格式PDF

  • 申请/专利权人 LG SILTRON INCORPORATED;

    申请/专利号KR20100002605

  • 发明设计人 LEE YU KYOUNG;CHO HUI DON;JEONG EUN DO;

    申请日2010-01-12

  • 分类号H01L21/302;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:25

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