首页> 外国专利> POLISHING PAD FOR POLISHING A SEMICONDUCTOR WAFER CAPABLE OF ELIMINATING EDGE ROLL-OFF IN THE EDGE REGION OF THE SEMICONDUCTOR WAFER AND A SEMICONDUCTOR WAFER POLISHING METHOD

POLISHING PAD FOR POLISHING A SEMICONDUCTOR WAFER CAPABLE OF ELIMINATING EDGE ROLL-OFF IN THE EDGE REGION OF THE SEMICONDUCTOR WAFER AND A SEMICONDUCTOR WAFER POLISHING METHOD

机译:用于抛光可消除半导体晶片边缘区域中的边缘滚落的半导体晶片的抛光垫和半导体晶片抛光方法

摘要

PURPOSE: A polishing pad for polishing a semiconductor wafer and a semiconductor wafer polishing method are provided to increase the planarity of the rear surface and/or front surface of the semiconductor wafer, thereby providing the good quality of the semiconductor wafer.;CONSTITUTION: A polishing pad comprises an abrasive layer, a layer comprised of rigid plastic, and a non-woven fabric compliant layer. The layers described above are combined each other by an adhesive layer. The layer comprised of the rigid plastic includes polycarbonate. The compliant layer includes polyester fiber. The abrasive layer includes an oxide particle or hard material particle comprised of cerium, aluminum, silicon or zirconium.;COPYRIGHT KIPO 2012
机译:目的:提供用于抛光半导体晶片的抛光垫和半导体晶片抛光方法,以增加半导体晶片的后表面和/或前表面的平面度,从而提供良好的半导体晶片质量。抛光垫包括磨料层,由刚性塑料组成的层和非织造织物顺应层。上述各层通过粘合剂层彼此结合。由硬质塑料组成的层包括聚碳酸酯。柔顺层包括聚酯纤维。磨料层包括由铈,铝,硅或锆组成的氧化物颗粒或硬质材料颗粒。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20110112246A

    专利类型

  • 公开/公告日2011-10-12

    原文格式PDF

  • 申请/专利权人 SILTRONIC AG;

    申请/专利号KR20110084160

  • 发明设计人 SCHWANDNER JUERGEN;KOPPERT ROLAND;

    申请日2011-08-23

  • 分类号H01L21/304;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:57

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