首页> 外国专利> ION BEAM ANGLE CALIBRATION AND EMITTANCE MEASUREMENT SYSTEM FOR RIBBON BEAMS

ION BEAM ANGLE CALIBRATION AND EMITTANCE MEASUREMENT SYSTEM FOR RIBBON BEAMS

机译:色带束的离子​​束角度校准和发射率测量系统

摘要

An ion beam angle calibration and emittance measurement system, comprising a plate comprising an elongated slit therein, wherein the elongated slit positioned at a rotation center of the plate and configured to allow a first beam portion to pass therethrough. A beam current detector located downstream of the plate, wherein the beam current detector comprises a slit therein configured to permit a second beam portion of the first beam portion to pass therethrough, wherein the beam current detector is configured to measure a first beam current associated with the first beam portion. A beam angle detector is located downstream of the beam current detector and configured to detect a second beam current associated with the second beam portion. The plate, the current beam detector and the beam angle detector are configured to collectively rotate about the rotation center of the plate.
机译:一种离子束角度校准和发射率测量系统,包括其中包括细长狭缝的板,其中所述细长狭缝位于所述板的旋转中心并被构造为允许第一束流部分穿过。位于板的下游的束电流检测器,其中束电流检测器包括在其中的狭缝,其配置成允许第一束部分的第二束部分从中穿过,其中束电流检测器被配置成测量与第一梁部分。束角检测器位于束电流检测器的下游并且被配置为检测与第二束部分相关联的第二束电流。板,当前束检测器和束角检测器被配置为绕板的旋转中心共同旋转。

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