首页> 外国专利> ION BEAM ANGLE CALIBRATION AND EMITTANCE MEASUREMENT SYSTEM FOR RIBBON BEAMS

ION BEAM ANGLE CALIBRATION AND EMITTANCE MEASUREMENT SYSTEM FOR RIBBON BEAMS

机译:色带束的离子​​束角度校准和发射率测量系统

摘要

An ion beam angle calibration and emittance measurement system (200) comprising a plate having elongate slits (204) therein, wherein the elongated slit (204) is located at the center of rotation of the plate . A beam current detector is configured to measure a first beam current associated with the first beam portion (213), and includes a slit (208) configured to pass a second beam portion (215) of the first beam portion And is located downstream of the plate. A beam angle detector 206 is located downstream of the beam current detector and is configured to detect a second beam current associated with the second beam portion. The plate, the beam current detector and the beam angle detector are configured to collectively rotate about the rotational center of the plate.;
机译:离子束角度校准和发射率测量系统(200),包括其中具有细长狭缝(204)的板,其中细长狭缝(204)位于板的旋转中心。束电流检测器被配置为测量与第一束部分(213)相关联的第一束电流,并且包括缝(208),该缝被配置为通过第一束部分的第二束部分(215),并且位于缝隙的下游。盘子。束角检测器206位于束电流检测器的下游并且被配置为检测与第二束部分相关联的第二束电流。板,束电流检测器和束角检测器配置为围绕板的旋转中心共同旋转。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号