首页>
外国专利>
ION BEAM ANGLE CALIBRATION AND EMITTANCE MEASUREMENT SYSTEM FOR RIBBON BEAMS
ION BEAM ANGLE CALIBRATION AND EMITTANCE MEASUREMENT SYSTEM FOR RIBBON BEAMS
展开▼
机译:色带束的离子束角度校准和发射率测量系统
展开▼
页面导航
摘要
著录项
相似文献
摘要
An ion beam angle calibration and emittance measurement system (200) comprising a plate having elongate slits (204) therein, wherein the elongated slit (204) is located at the center of rotation of the plate . A beam current detector is configured to measure a first beam current associated with the first beam portion (213), and includes a slit (208) configured to pass a second beam portion (215) of the first beam portion And is located downstream of the plate. A beam angle detector 206 is located downstream of the beam current detector and is configured to detect a second beam current associated with the second beam portion. The plate, the beam current detector and the beam angle detector are configured to collectively rotate about the rotational center of the plate.;
展开▼