首页> 外国专利> PHASE CHANGE MEMORY DEVICE FOR DECREASING DISTURBANCE CAPABLE OF REDUCING A CONTACT AREA WITH A PHASE CHANGE MATERIAL AND MAXIMIZING A HEATING CHARACTERISTIC AND A MANUFACTURING METHOD THEREOF

PHASE CHANGE MEMORY DEVICE FOR DECREASING DISTURBANCE CAPABLE OF REDUCING A CONTACT AREA WITH A PHASE CHANGE MATERIAL AND MAXIMIZING A HEATING CHARACTERISTIC AND A MANUFACTURING METHOD THEREOF

机译:相变存储装置,用于通过相变材料减小减小接触面积的干扰能力,并最大程度地提高加热特性及其制造方法

摘要

PURPOSE: A phase change memory device and a manufacturing method thereof are provided to eliminate heat dispersed to an adjacent memory cell in heating for writing a memory cell by forming a heat absorption layer between memory cells which are placed on the same bit line.;CONSTITUTION: A plurality of bit lines(170) is arranged to be crossed with a plurality of word lines(110). A switching element(120) is respectively arranged in the cross point of the bit line and the word line. Heating electrodes are respectively connected to the switching element. A heat absorption layer(150b) is placed between neighboring heating electrodes. A phase change film(165) is formed in the upper part of the heating electrodes and the heat absorption layer.;COPYRIGHT KIPO 2012
机译:目的:提供一种相变存储器件及其制造方法,以通过在放置在同一位线上的存储单元之间形成吸热层,消除在加热写入存储单元时散布到相邻存储单元的热量。 :多条位线(170)被布置为与多条字线(110)交叉。开关元件(120)分别布置在位线和字线的交叉点中。加热电极分别连接到开关元件。吸热层(150b)放置在相邻的加热电极之间。在加热电极和吸热层的上部形成相变膜(165)。;COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20110121386A

    专利类型

  • 公开/公告日2011-11-07

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20100040959

  • 发明设计人 PARK NAM KYUN;

    申请日2010-04-30

  • 分类号H01L27/115;H01L21/8247;H01L27/10;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:46

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号