首页> 外国专利> HIGHLY INTEGRATED PHASE CHANGE MEMORY DEVICE AND MANUFACTURING METHOD THEREOF CAPABLE OF ENHANCING RESET CURRENT FEATURES BY REDUCING THE SIZE OF AN AREA WHERE A PHASE CHANGE NANO BAND CONTACTS A HEATING ELECTRODE

HIGHLY INTEGRATED PHASE CHANGE MEMORY DEVICE AND MANUFACTURING METHOD THEREOF CAPABLE OF ENHANCING RESET CURRENT FEATURES BY REDUCING THE SIZE OF AN AREA WHERE A PHASE CHANGE NANO BAND CONTACTS A HEATING ELECTRODE

机译:高度集成的相变存储器件及其制造方法,能够通过减小相变纳米带与加热电极接触的区域的尺寸来增强复位电流特性

摘要

PURPOSE: A highly integrated phase change memory device and manufacturing method thereof are provided to contact a plurality of phase change bands whose phase change features are different by one heating electrode, thereby realizing a multi level by a simple method by generating resistance distribution under different operation conditions.;CONSTITUTION: An insulating film(110) is formed on a semiconductor substrate(100) with an access device(115). A heating electrode(120) is formed on the access device. The heating electrode has the same line width as the access device. A phase change nano band(140) is formed on the heating electrode. An interlayer insulating film(150) is formed on both sides of the phase change nano band to support the phase change nano band.;COPYRIGHT KIPO 2011
机译:用途:提供一种高度集成的相变存储器件及其制造方法,以通过一个加热电极接触其相变特征不同的多个相变带,从而通过在不同操作下产生电阻分布的简单方法来实现多电平组成:绝缘膜(110)形成在具有存取装置(115)的半导体衬底(100)上。加热电极(120)形成在进入装置上。加热电极的线宽与访问设备的线宽相同。在加热电极上形成相变纳米带(140)。在相变纳米带的两侧形成层间绝缘膜(150),以支撑相变纳米带。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110058385A

    专利类型

  • 公开/公告日2011-06-01

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090115153

  • 发明设计人 LEE SE HO;

    申请日2009-11-26

  • 分类号H01L27/115;H01L21/8247;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:47

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