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adjacent memory cells of programming over programmed memory cells after detection

机译:检测后在编程存储单元上编程的相邻存储单元

摘要

In a non- volatile semiconductor memory system ( or other type of memory system ) , the memory cell of the memory cell is programmed by changing the threshold voltage . Because of the difference in the programming speed of different memory cells in the system , there is a possibility that some of the memory cell is over programmed . That is , in one example , the threshold voltage will be moved quickly from the intended value or range of values . The invention includes determining whether the over programming due to the programming of the memory cell is the cell adjacent row .
机译:在非易失性半导体存储系统(或其他类型的存储系统)中,通过改变阈值电压来对存储单元的存储单元进行编程。由于系统中不同存储单元的编程速度不同,因此某些存储单元可能会被过度编程。也就是说,在一个示例中,阈值电压将迅速从预期值或值范围移开。本发明包括确定由于对存储器单元的编程而引起的过度编程是否是单元相邻行。

著录项

  • 公开/公告号KR101049582B1

    专利类型

  • 公开/公告日2011-07-15

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20067002056

  • 申请日2004-07-07

  • 分类号G11C16/34;G11C16/10;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:03

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