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plasma deposition technique using nano- crystalline silicon membrane structure , forming his way , having a nanocrystalline silicon film structure non-volatile memory device and its forming method

机译:利用纳米晶硅膜结构的等离子体沉积技术,形成方法,具有纳米晶硅膜结构的非易失性存储器件及其形成方法

摘要

The invention nanocrystalline silicon film structure using a plasma deposition technique, and his method of forming a nanocrystalline silicon film relates to non-volatile memory element and its forming method includes a structure, according to the method of forming the nano-crystal silicon film structure, comprising: forming a buffer on the substrate and a gas containing silicon and each hydrogen on the buffer layer a step of forming a nano-crystal silicon by plasma deposition technique using a. ; The nano-crystal silicon film by using a plasma deposition technique, such as the structure, its forming method, comprising the nano-crystal silicon film structure non-volatile memory device and by its forming method, the prior art process and nano-crystal silicon on a glass substrate by a plasma vapor deposition method without performing the film deposition by directly reducing the manufacturing process of the non-volatile memory device, such as in the production costs can be reduced.
机译:利用等离子体沉积技术的本发明的纳米晶硅膜结构,其形成纳米晶硅膜的方法涉及非易失性存储元件,并且其形成方法包括根据形成纳米晶硅膜结构的方法的结构,包括:在基板上形成缓冲剂,并在缓冲层上形成包含硅和氢的气体的步骤;使用等离子体通过等离子体沉积技术形成纳米晶体硅的步骤。 ;通过使用等离子沉积技术的纳米晶硅膜的结构,其形成方法,包括该纳米晶硅膜结构的非易失性存储器件及其形成方法,现有技术的工艺和纳米晶硅通过直接减少非易失性存储器件的制造工艺,例如,通过等离子体气相沉积法在玻璃基板上进行等离子体沉积而无需执行膜沉积,从而可以降低生产成本。

著录项

  • 公开/公告号KR101062998B1

    专利类型

  • 公开/公告日2011-09-07

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080128316

  • 申请日2008-12-17

  • 分类号H01L21/205;H01L27/115;B82Y10/00;

  • 国家 KR

  • 入库时间 2022-08-21 17:49:48

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