Substrate atomic force microscopy

摘要

The invention relates to devices used in the technique of atomic force microscopy, namely organic substrates for research and biological objects.; The substrate of an atomic force microscope comprises a silicon wafer coated with a film of Langmuir - Blodgett (LB) of five monomolecular layers of an organic compound with a total film thickness of 6.5 nm. The organic compound is tetratsianopropoksi-p-tert-butyl-thiacalix [4] arene (hereinafter - thiacalix [4] arene) of formula:; The inventive substrate atomic force microscope for applying the test samples of nanoscale has an atomically smooth surface with a size of the irregularities is not greater than 1 nm, high hydrophobicity, resistance to organic solvents and ease of manufacture. 1 Head. n. vor ly. 3 FIG.