Device for determining e.g. refraction index of V or wedge shaped samples, has adjusting device adjusting rotational angle of deflecting mirror, and measuring telescope firmly arranged opposite to beam directed towards prism

摘要

The device has a retainer (50) defined by inner prism surfaces (52, 53) diagonally arranged to each other. A light source (9) and a V-block prism (5) are arranged relative to each other such that light beam (11) radiated from the source passes through a light entrance surface (51), the prism surfaces and a light exit surface (54). A measuring unit (15) determines a deflection angle of the beam withdrawing from the exit surface. An adjusting device adjusts a rotational angle of a deflecting mirror (13). A measuring telescope is firmly arranged opposite to the beam directed towards the prism. An independent claim is also included for a method for determination of a refraction index of a sample.