Fit method and scanning BIST test configuration of the scan BIST architecture to low-power operation

摘要

A Scan-BIST architecture is adapted into a low power Scan-BIST architecture. A generator 102, compactor 106, and controller 110 remain the same as in the known art. The changes between the known art Scan-BIST architecture and the low power Scan-BIST architecture involve modification of the known Scan path into Scan path 502, to insert Scan paths A 506, B 508 and C 510, and the insertion of an adaptor circuit 504 in the control path 114 between controller 110 and Scan path 502. IMAGE