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And a method of manufacturing the bonded substrate GaN thin film, as well as processes for the preparation thereof and the GaN-based semiconductor device

机译:以及制造键合衬底GaN薄膜的方法,其制备方法和GaN基半导体器件

摘要

PROBLEM TO BE SOLVED: To provide a GaN thin film bonded substrate and its manufacturing method where the GaN thin film is firmly bonded to a different kind of substrate whose chemical constitution is distinct from the GaN; and also to provide a GaN system semiconductor device and its manufacturing method including at least one layer of the GaN system semiconductor layers formed on the GaN thin film, so as to reduce the manufacturing cost of the semiconductor device.;SOLUTION: The manufacturing method of the GaN thin film bonding substrate 1 comprises: a process for bonding a different kind of substrate 20 whose chemical constitution is distinct from the GaN to a GaN bulk crystal 10; and a process for forming a GaN thin film 10a on the different kind of substrate 20, by dividing the GaN bulk crystal 10 by a plane 10t having a distance of 0.1 μm or more and 100 μm or less from the interface with the different kind of substrate 20. The maximum surface roughness Rmax of the bonding surface of the GaN bulk crystal is 20 μm or less.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种GaN薄膜键合衬底及其制造方法,其中,GaN薄膜牢固地键合到化学构造不同于GaN的另一种衬底上。还提供了一种GaN系统半导体器件及其制造方法,包括至少一层形成在GaN薄膜上的GaN系统半导体层,从而降低了半导体器件的制造成本。 GaN薄膜接合基板1包括:将化学组成与GaN不同的另一种基板20接合至GaN块状晶体10的工序。通过将GaN块状晶体10除以与界面之间的距离为0.1μm以上且100μm以下的平面10t,在不同种类的基板20上形成GaN薄膜10a的方法。 GaN块状晶体的键合表面的最大表面粗糙度Rmax为20μm或更小。版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP5003033B2

    专利类型

  • 公开/公告日2012-08-15

    原文格式PDF

  • 申请/专利权人 住友電気工業株式会社;

    申请/专利号JP20060182118

  • 申请日2006-06-30

  • 分类号H01L21/02;H01L21/338;H01L29/812;H01L29/778;H01L29/808;H01L21/337;H01L21/265;H01L29/12;H01L29/78;H01L21/336;H01L33/32;H01L21/20;

  • 国家 JP

  • 入库时间 2022-08-21 17:40:29

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