PROBLEM TO BE SOLVED: To provide a method for measuring semiconductor type CNT content in a CNT by which measurement corresponding to electric characteristics is possible.;SOLUTION: The method for measuring the semiconductor type CNT content in the CNT includes: an on/off ratio measurement process of measuring on/off ratio of a field effect transistor (FET) which has a channel formed by the carbon nano-tube (CNT) by changing area density of the CNT in the channel; and a semiconductor type CNT content calculation process of calculating the semiconductor type CNT content in the CNT based on correlation between the on/off ratio and the CNT area density, on resistance of the FET, carrier mobility of the FET, or on current of the FET.;COPYRIGHT: (C)2012,JPO&INPIT
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