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DIAGNOSTIC SYSTEM OF DAC AMPLIFIER, CHARGED PARTICLE BEAM LITHOGRAPHY APPARATUS AND DIAGNOSTIC METHOD OF DAC AMPLIFIER

机译:DAC放大器的诊断系统,带电粒子束光刻设备和DAC放大器的诊断方法

摘要

PROBLEM TO BE SOLVED: To diagnose a DAC amplifier reliably even when the speed of the DAC amplifier which deflects a charged particle beam is increased.;SOLUTION: A charged particle beam is passed between electrodes 14a, 14b arranged to face each other, and deflected by the voltage difference between the electrodes 14a, 14b. When it is diagnosed whether DAC amplifiers 20, 21 are normal or not, digital voltage information input to the DC amplifier 20 and the output voltage from the DC amplifier 21 are matched. The DAC amplifiers 20, 21 are diagnosed by detecting shift of the charged particle beam irradiation position when application of the same voltage to the electrodes 14a, 14b is instructed.;COPYRIGHT: (C)2012,JPO&INPIT
机译:要解决的问题:即使增加偏转带电粒子束的DAC放大器的速度,也要可靠地诊断DAC放大器;解决方案:带电粒子束在相互面对的电极14a,14b之间通过并偏转通过电极14a,14b之间的电压差。当诊断出DAC放大器20、21是否正常时,输入到DC放大器20的数字电压信息与来自DC放大器21的输出电压匹配。当指示向电极14a,14b施加相同电压时,通过检测带电粒子束照射位置的偏移来诊断DAC放大器20、21.COPYRIGHT:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP2012044051A

    专利类型

  • 公开/公告日2012-03-01

    原文格式PDF

  • 申请/专利权人 NUFLARE TECHNOLOGY INC;

    申请/专利号JP20100185239

  • 发明设计人 MUROFUSHI TATSUYA;

    申请日2010-08-20

  • 分类号H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-21 17:40:11

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