首页> 外国专利> SILICON CARBIDE POWER METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR HAVING SHORTING CHANNEL AND METHODS OF FABRICATING SILICON CARBIDE METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR HAVING SHORTING CHANNEL

SILICON CARBIDE POWER METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR HAVING SHORTING CHANNEL AND METHODS OF FABRICATING SILICON CARBIDE METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR HAVING SHORTING CHANNEL

机译:具有缩短通道的碳化硅功率金属氧化物半导体场效应晶体管及制造方法具有缩短通道的碳化硅金属氧化物半导体场效应晶体管的制备方法

摘要

PROBLEM TO BE SOLVED: To realize manufacturing of a high current, high voltage, low on-resistance, vertical SiC power MOSFET, which has been impractical, at least in part, due to the poor surface mobility of electrons in an inversion layer.SOLUTION: A silicon carbide metal-oxide semiconductor field effect transistor (MOSFET) and a method of fabricating the silicon carbide MOSFET are provided. The silicon carbide MOSFET has an n-type silicon carbide drift layer, spaced-apart p-type silicon carbide regions existing in the n-type silicon carbide drift layer and having n-type silicon carbide regions therein, and a nitrided oxide layer. The MOSFET also has n-type shorting channels extending from respective n-type silicon carbide regions through the p-type silicon carbide regions to the n-type silicon carbide drift layer.
机译:要解决的问题:要实现大电流,高电压,低导通电阻的垂直SiC功率MOSFET的制造,这至少部分是由于反转层中电子的表面迁移率差而不切实际的。 :提供了一种碳化硅金属氧化物半导体场效应晶体管(MOSFET)和一种制造碳化硅MOSFET的方法。碳化硅MOSFET具有n型碳化硅漂移层,存在于n型碳化硅漂移层中并在其中具有n型碳化硅区域的间隔开的p型碳化硅区域以及氮化氧化物层。 MOSFET还具有从相应的n型碳化硅区域穿过p型碳化硅区域延伸到n型碳化硅漂移层的n型短路通道。

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