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Delay circuit, test equipment, programs, semiconductor chips, initialization methods, and, initialization circuit

机译:延迟电路,测试设备,程序,半导体芯片,初始化方法以及初始化电路

摘要

PROBLEM TO BE SOLVED: To accurately measure the delay amount of a delay element.;SOLUTION: The delay circuit comprises: a first delay element; a second delay element; and an initialization part for measuring the delay amount generated to each delay setting value by the first delay element and initializing the first delay element. The initialization part comprises: a first loop route for inputting the output signals of the first delay element to the first delay element; a second loop route for inputting the output signals of the second delay element to the second delay element; a first measurement part for successively setting a different delay setting value to the first delay element and successively measuring the delay amount of the first delay element; a second measurement part for measuring the delay amount in the second delay element in synchronism with the first measurement part without changing the delay setting value of the second delay element; and a delay amount calculation part for correcting the delay amount measured by the first measurement part by using the delay amount measured in synchronism with the delay amount by the second measurement part.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:准确地测量延迟元件的延迟量。解决方案:延迟电路包括:第一延迟元件;和第二延迟元件;初始化部分,用于测量由第一延迟元件对每个延迟设定值产生的延迟量,并对第一延迟元件进行初始化。初始化部分包括:第一回路路径,用于将第一延迟元件的输出信号输入到第一延迟元件;第二回路路径,用于将第二延迟元件的输出信号输入到第二延迟元件;第一测量部,其对第一延迟元件依次设定不同的延迟设定值,并依次测量第一延迟元件的延迟量。第二测量部件,用于与第一测量部件同步地测量第二延迟元件中的延迟量,而不改变第二延迟元件的延迟设定值。延迟量计算部分,用于通过使用与第二测量部分的延迟量同步测量的延迟量来校正第一测量部分所测量的延迟量。版权所有:(C)2008,JPO&INPIT

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