首页>
外国专利>
METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE COATING AND METHOD FOR CONTROLLING HAZARDOUS ELEMENT IN ENCAPSULATING RESIN OF RESIN ENCAPSULATION SEMICONDUCTOR DEVICE
METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE COATING AND METHOD FOR CONTROLLING HAZARDOUS ELEMENT IN ENCAPSULATING RESIN OF RESIN ENCAPSULATION SEMICONDUCTOR DEVICE
展开▼
机译:树脂包封半导体装置中树脂中铬含量的定量分析方法及控制树脂中有害元素的控制方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method for controlling a hazardous element in an encapsulating resin of a resin encapsulation semiconductor device includes subjecting the device to qualitative analysis with a fluorescent X-ray analyzer to judge whether the hazardous element is contained in the encapsulating resin, aligning a plurality of devices with each of upper and lower surfaces of the devices brought into a plane, setting the surfaces of the devices to cover a full X-ray irradiation plane and subjecting the devices to quantitative analysis with the fluorescent X-ray analyzer to obtain an analytical value of the hazardous element in the encapsulating resin for upper and lower surfaces of the devices, and judging whether the analytical value of the hazardous element which is less influenced by a coexistent element of the analytical values for the upper and lower surfaces of the devices exceeds a threshold value.
展开▼