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Method for Increasing Reverse Breakdown Voltage Between P-Well and N-Well and related Semiconductor Silicon Devices

机译:增加p阱和n阱之间的反向击穿电压的方法及相关的半导体硅器件

摘要

A method for improving the reverse breakdown voltage between P-well and N-well and related semiconductor silicon devices are described herein. In one aspect, a semiconductor silicon device comprises a substrate; a P-well in said substrate; an N-well in said substrate; wherein said N-well and said P-well are separated by said substrate. In another aspect, a method for increasing the reverse breakdown voltage from P-well to N-well comprises: providing a substrate; forming an N-well and a P-well in said substrate and separating said N-well and said P-well by said substrate.
机译:本文描述了一种用于改善P阱和N阱之间的反向击穿电压的方法以及相关的半导体硅器件。在一个方面,一种半导体硅器件包括衬底;和在所述衬底中的P阱;所述底物中的N阱;其中所述N阱和所述P阱被所述衬底分开。在另一方面,一种用于将反向击穿电压从P阱增加到N阱的方法包括:提供衬底;以及将衬底从衬底上移到衬底。在所述衬底中形成N阱和P阱,并通过所述衬底分离所述N阱和所述P阱。

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