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Method for designing wiring topology for electromigration avoidance and fabrication method of integrate circuits including said method
Method for designing wiring topology for electromigration avoidance and fabrication method of integrate circuits including said method
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机译:设计用于避免电迁移的布线拓扑的方法以及包括该方法的集成电路的制造方法
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摘要
A method for designing wiring topology for electromigration avoidance, which is composed of multiple sources, multiple sinks and multiple wires, is disclosed. The steps of said method to get an optimal topology includes: 1. calculating the length of all the wires to choose one of the wires with the shortest length as a feasible wire, 2. deciding a capacity of the feasible wire, 3. deciding the capacities of the other wire according to the capacity of the feasible wire, a flow of the source of the feasible wire and a flow of the sink of the feasible wire, 4. comparing the length of the other wires to select another feasible wire, 5. repeating said steps until finding all feasible wires for constructing a feasible topology, 6. creating a flow network according to the feasible topology, 7. iteratively checking if a negative cycle exists in the flow network and removing it until no more negative cycles.
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