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Method and apparatus of operating a non-volatile DRAM

机译:操作非易失性dram的方法和设备

摘要

A non-volatile DRAM cell includes a pass-gate transistor and a cell capacitor. A read operation of the non-volatile cell begins by negatively charging the cell capacitor. A cell capacitor of an associated dummy non-volatile DRAM cell is fully discharged. The pass-gate transistor is activated and if the pass-gate transistor is programmed it does not turn on and if it is erased, it turns on. Charge is shared on the complementary pair of precharged bit lines connected to the non-volatile DRAM cell and its associated Dummy non-volatile DRAM cell. A sense amplifier detects the difference in the data state stored in the pass-gate transistor. The program and erase of the non-volatile DRAM cell is accomplished by charge injection from the associated bit line of the non-volatile DRAM cell.
机译:非易失性DRAM单元包括传输门晶体管和单元电容器。非易失性单元的读取操作通过对单元电容器进行负充电开始。相关的伪非易失性DRAM单元的单元电容器被完全放电。传输门晶体管被激活,如果对传输门晶体管进行了编程,则它不会导通,如果被擦除,它将导通。电荷在连接到非易失性DRAM单元及其关联的虚拟非易失性DRAM单元的一对预充电位线的互补对上共享。读出放大器检测存储在传输门晶体管中的数据状态的差异。非易失性DRAM单元的编程和擦除通过从非易失性DRAM单元的相关位线注入电荷来完成。

著录项

  • 公开/公告号US8059471B2

    专利类型

  • 公开/公告日2011-11-15

    原文格式PDF

  • 申请/专利权人 WINGYU LUENG;

    申请/专利号US20080316436

  • 发明设计人 WINGYU LUENG;

    申请日2008-12-12

  • 分类号G11C11/34;

  • 国家 US

  • 入库时间 2022-08-21 17:26:45

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