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Semiconductor device having pads and which minimizes defects due to bonding and probing processes

机译:具有焊盘的半导体器件,其最小化由于键合和探测过程而导致的缺陷

摘要

A semiconductor device includes: a semiconductor substrate; a first interlayer insulating film formed over the semiconductor substrate; a pad formed above the first interlayer insulating film; and a plurality of first interconnects spaced apart from each other in a portion of the first interlayer insulating film located below the pad. Below the pad, the first interconnects are formed in quadrangular plan shapes.
机译:一种半导体器件,包括:半导体衬底;以及半导体器件。在半导体衬底上形成的第一层间绝缘膜;在第一层间绝缘膜上方形成的焊盘;在位于所述焊盘下方的所述第一层间绝缘膜的一部分中,彼此间隔开的多个第一互连。在焊盘下方,第一互连形成为四边形平面形状。

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