首页>
外国专利>
METHOD OF MATERIAL ANALYSIS BY MEANS OF A FOCUSED ELECTRON BEAM USING CHARACTERISTIC X-RAYS AND BACK-SCATTERED ELECTRONS AND THE EQUIPMENT TO PERFORM IT
METHOD OF MATERIAL ANALYSIS BY MEANS OF A FOCUSED ELECTRON BEAM USING CHARACTERISTIC X-RAYS AND BACK-SCATTERED ELECTRONS AND THE EQUIPMENT TO PERFORM IT
展开▼
机译:利用特征X射线和反散射电子通过聚焦电子束进行材料分析的方法及其所用的设备
展开▼
页面导航
摘要
著录项
相似文献
摘要
A material analysis method by a focused electron beam and an equipment for performing such an analysis where an electron map B is created describing the intensity of emitted back-scattered electrons at various points on a sample, and a spectral map S is created describing the intensity of emitted X-rays at points on the sample depending on the radiation energy. For selected chemical elements, X-ray maps Mi are created representing the intensity of X-rays characteristic for such elements. The X-ray maps Mi and the electron map B are converted into differential X-ray maps Di, which are subsequently merged into a final differential X-ray map D. The final differential X-ray map D is then used to search particles. Subsequently, a cumulative X-ray spectrum Xj is calculated for each particle and subsequently the classification of particles based on the peak intensities and the intensity of back-scattered electron is performed.
展开▼