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Process for digging a deep trench in a semiconductor body and semiconductor body so obtained

机译:在半导体本体中挖深沟槽的方法及由此获得的半导体本体

摘要

A process for digging deep trenches in a body of semiconductor material envisages: forming a mask (3) having at least one opening (5), above a surface (2a) of a semiconductor body (2); forming a passivating layer (6, 6') conformally on the mask (3) and on the semiconductor body (2) within the opening (5); executing a directional etch so as to first remove the passivating layer (6, 6') at least from on top of the semiconductor body (2) and then etch the semiconductor body (2) through the opening (5). The steps of forming a passivating layer (6, 6') and executing a directional etch are carried out repeatedly in sequence so as to form a trench (10) through the opening (5). In a step of the process, moreover, a tapered portion (10") of the trench (10) is formed, which has a transverse dimension (W") decreasing as a distance (D) from the surface (2a) of the semiconductor body (2) increases.
机译:设想一种在半导体材料的主体中挖深沟槽的方法:在半导体主体(2)的表面(2a)上方形成具有至少一个开口(5)的掩模(3);在掩模(3)和开口(5)内的半导体本体(2)上共形地形成钝化层(6、6');执行定向蚀刻,以便首先至少从半导体本体(2)的顶部上去除钝化层(6、6'),然后通过开口(5)蚀刻半导体本体(2)。依次重复执行形成钝化层(6、6')和执行定向蚀刻的步骤,以形成穿过开口(5)的沟槽(10)。此外,在该工艺的步骤中,形成沟槽(10)的锥形部分(10”),该锥形部分的横向尺寸(W”)随着距半导体表面(2a)的距离(D)而减小。身体(2)增加。

著录项

  • 公开/公告号EP1804281B1

    专利类型

  • 公开/公告日2011-12-14

    原文格式PDF

  • 申请/专利权人 ST MICROELECTRONICS SRL;

    申请/专利号EP20050425930

  • 发明设计人 COLOMBO ROBERTO;

    申请日2005-12-28

  • 分类号H01L21/3065;H01L21/762;

  • 国家 EP

  • 入库时间 2022-08-21 17:18:16

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