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MONOLITHIC INTEGRATED CMUTS FABRICATED BY LOW-TEMPERATURE WAFER BONDING

机译:低温硅片键合制造的单分子综合性面包

摘要

Low temperature wafer bonding (temperature of 450 °C or less) is employed to fabricate CMUTs on a wafer that already includes active electrical devices. The resulting structures are CMUT arrays integrated with active electronics by a low-temperature wafer bonding process. The use of a low-temperature process preserves the electronics during CMUT fabrication. With this approach, it is not necessary to make compromises in the CMUT or electronics designs, as is typical of the sacrificial release fabrication approach. Various disadvantages of sacrificial release, such as low process control, poor design flexibility, low reproducibility, and reduced performance are avoided with the present approach. With this approach, a CMUT array can be provided with per-cell electrodes connected to the substrate integrated circuitry. This enables complete flexibility in electronically assigning the CMUT cells to CMUT array elements.
机译:低温晶圆键合(450°C或更低的温度)用于在已经包含有源电子器件的晶圆上制造CMUT。产生的结构是通过低温晶圆键合工艺与有源电子器件集成的CMUT阵列。低温工艺的使用可以在CMUT制造过程中保留电子器件。使用这种方法,就不必像牺牲型释放制造方法那样在CMUT或电子设计中做出妥协。使用本方法避免了牺牲释放的各种缺点,例如低的过程控制,差的设计灵活性,低的可再现性和降低的性能。通过这种方法,可以为CMUT阵列提供连接到基板集成电路的每单元电极。这使得在将CMUT单元电子分配给CMUT阵列元素方面具有完全的灵活性。

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