首页> 外国专利> METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE CAPABLE OF SUPPRESSING THE DECREASE OF A THRESHOLD VOLTAGE DUE TO A HOLE CHARGING

METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE CAPABLE OF SUPPRESSING THE DECREASE OF A THRESHOLD VOLTAGE DUE TO A HOLE CHARGING

机译:制造能够抑制由于孔充电而使阈值电压下降的半导体装置的方法

摘要

PURPOSE: A method for manufacturing a semiconductor device is provided to prevent a floating body effect by connecting a channel area to a substrate.;CONSTITUTION: A pillar pattern(105) including a sidewall contact is formed on the upper side of a semiconductor substrate. A silicon layer is formed on the lower side between the pillar patterns. Ions are injected to the silicon layer. An ion implantation area(130) is formed by diffusing impurity ions injected to the silicon layer to the pillar pattern. The silicon layer is removed. Conductive materials are buried in the lower side of the pillar pattern.;COPYRIGHT KIPO 2012
机译:用途:提供一种用于制造半导体器件的方法,以通过将沟道区域连接至基板来防止浮体效应。组成:包括侧壁接触的柱状图案(105)形成在半导体基板的上侧。在柱图案之间的下侧上形成硅层。离子注入到硅层。通过将注入到硅层的杂质离子扩散到柱图案来形成离子注入区域(130)。去除硅层。导电材料埋在支柱图案的下部。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120008803A

    专利类型

  • 公开/公告日2012-02-01

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20100069951

  • 发明设计人 JANG TAE SU;

    申请日2010-07-20

  • 分类号H01L21/336;H01L29/78;H01L21/8242;H01L27/108;

  • 国家 KR

  • 入库时间 2022-08-21 17:10:42

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