首页> 外国专利> METHOD OF MANUFACTURING RESISTIVE SWITCHING MEMORY USING LOW TEMPERATURE HIGH PRESSURE ANNEALING AND RESISTIVE SWITCHING MEMORY PREPARED BY USING THE METHOD

METHOD OF MANUFACTURING RESISTIVE SWITCHING MEMORY USING LOW TEMPERATURE HIGH PRESSURE ANNEALING AND RESISTIVE SWITCHING MEMORY PREPARED BY USING THE METHOD

机译:利用低温高压退火制造电阻式开关存储器的方法以及用该方法制备的电阻式开关存储器

摘要

PURPOSE: A method for manufacturing a resistance random access memory using low temperature and high pressure heating and a resistance random access memory manufactured using the same are provided to improve durability by increasing an adhesive force with a bottom electrode by depositing the optimal thickness of silicon dioxide and titanium on a silicon substrate. CONSTITUTION: A substrate is prepared(S10). A bottom electrode is formed by depositing a metal on the substrate(S20). An oxide layer is formed on a top portion of the bottom electrode(S30). The oxide layer is heat-treated and the oxide layer is crystallized(S40). A reactive metal is deposited on the top portion of the oxide layer(S50). An upper electrode is formed on the top portion of a reactive metal layer by depositing the non-reactive meta(S60).
机译:目的:提供一种使用低温和高压加热制造电阻随机存取存储器的方法以及使用该方法制造的电阻随机存取存储器,以通过沉积最佳厚度的二氧化硅来增加与底部电极的粘合力,从而提高耐用性。和钛在硅基板上。组成:准备好基板(S10)。通过在基板上沉积金属来形成底部电极(S20)。在底部电极的顶部上形成氧化物层(S30)。对氧化物层进行热处理并且使氧化物层结晶(S40)。反应性金属沉积在氧化物层的顶部上(S50)。通过沉积非反应性金属,在反应金属层的顶部上形成上电极(S60)。

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