首页> 外国专利> SEMICONDUCTOR LIGHT EMITTING DIODE CHIP CAPABLE OF TRACKING AND MANAGING A HISTORY OF A WAFER BASE PROCESS, A MANUFACTURING METHOD, AND A QUALITY MANAGEMENT METHOD THEREOF

SEMICONDUCTOR LIGHT EMITTING DIODE CHIP CAPABLE OF TRACKING AND MANAGING A HISTORY OF A WAFER BASE PROCESS, A MANUFACTURING METHOD, AND A QUALITY MANAGEMENT METHOD THEREOF

机译:能够追踪和管理晶片基工艺的历史的半导体发光二极管芯片,制造方法及其质量管理方法

摘要

PURPOSE: A semiconductor light emitting diode chip, a manufacturing method, and a quality management method thereof are provided to diagnose a cause of a problem according to characteristics of a package product within a wafer base process region by recognizing a chip information mark through a vision system or with naked eye after completing a package.;CONSTITUTION: A semiconductor laminated body(12) is arranged on a substrate(11). The semiconductor laminated body comprises a first compound semiconductor layer(12a), a second compound semiconductor layer(12b), and an active layer(12c). A transparent electrode layer(14) is arranged on the upper surface of the second compound semiconductor layer. A first electrode(15) and a second electrode are respectively and electrically connected to the first and second compound semiconductor layers. A chip information mark is formed on the upper surface of the second compound semiconductor layer. The chip information mark displays information related to a wafer base process.;COPYRIGHT KIPO 2012
机译:目的:提供一种半导体发光二极管芯片,其制造方法及其质量管理方法,以通过基于视觉识别芯片信息标记,根据晶片基础处理区域内的封装产品的特征来诊断问题的原因。系统或完成包装后用肉眼观察。;组成:半导体叠层体(12)布置在基板(11)上。半导体层叠体包括第一化合物半导体层(12a),第二化合物半导体层(12b)和活性层(12c)。透明电极层(14)布置在第二化合物半导体层的上表面上。第一电极(15)和第二电极分别电连接到第一和第二化合物半导体层。芯片信息标记形成在第二化合物半导体层的上表面上。芯片信息标记显示与晶圆基本工艺相关的信息。; COPYRIGHT KIPO 2012

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