PURPOSE: A dead pixel compensating test apparatus is provided to compensate a dead pixel of an image sensor in image data of an image sensor through a dead pixel compensation algorithm.;CONSTITUTION: A pattern generating unit(110) generates a programmable test pattern. A register array(120) stores the test pattern. A dead pixel compensating unit(130) receives the stored test pattern. The dead pixel compensating unit outputs compensation data by the dead pixel compensation algorithm. A determining unit(140) determines defect of the dead pixel compensation algorithm by comparison of the compensation data and the test pattern.;COPYRIGHT KIPO 2012
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