DEAD PIXEL COMPENSATION TESTING APPARATUS

摘要

the present invention, at least one of the dead pixels in the data for the test pattern comprises a programmable generator for a pattern generation unit, and a register array for storing a test pattern, and a dead pixel compensation unit performs a test receives the pattern dead pixel compensation algorithm stored in the register array for outputting the compensation data, the test pattern and compares the dead compensation data and a determining section for determining whether or not the pixel defect compensation algorithm, to select any one of the image data supplied from the test pattern and the image sensor is stored in the register array and a multiplexer for providing the dead pixel compensation unit, supplied from the image sensor dead pixels in the image data and provides a test apparatus for testing a dead pixel compensation compensation algorithm for compensating the dead pixels of the image sensor. ;