首页> 外国专利> SUBSTRATE PLANARIZING METHOD CAPABLE OF FORMING A PLANARIZED SUBSTRATE BY DEVELOPING A PHOTORESIST LAYER

SUBSTRATE PLANARIZING METHOD CAPABLE OF FORMING A PLANARIZED SUBSTRATE BY DEVELOPING A PHOTORESIST LAYER

机译:能够通过形成光致抗蚀剂层来形成平面化基板的基板平面化方法

摘要

PURPOSE: A substrate planarizing method is provided to prevent a spot in the following process by planarizing a substrate through a rear exposure process.;CONSTITUTION: A top metal layer and a bottom metal layer are formed on the upper side of a substrate(100). A bottom layer(110p) and a top layer(120p) are formed on the substrate by etching the top metal layer and the bottom metal layer. A photoresist layer(PR) covers the substrate, the bottom layer, and the top layer. The photoresist layer is exposed by irradiating the lower side of the substrate. The exposed top layer and bottom layer are successively removed by using etchants.;COPYRIGHT KIPO 2012
机译:目的:提供一种基板平坦化方法,以通过后曝光工艺对基板进行平坦化处理,以防止在后续工艺中出现斑点。组成:在基板的上侧形成顶部金属层和底部金属层(100) 。通过蚀刻顶部金属层和底部金属层在衬底上形成底层(110p)和顶层(120p)。光致抗蚀剂层(PR)覆盖基板,底层和顶层。通过照射基板的下侧使光致抗蚀剂层暴露。通过使用蚀刻剂依次去除暴露的顶层和底层。COPYRIGHTKIPO 2012

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