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MANUFACTURING METHOD OF A SILICON WIRE ARRAY BY AN ELECTROCHEMICAL ETCHING METHOD

机译:电化学刻蚀法制造硅线阵

摘要

PURPOSE: A manufacturing method of a silicon wire array by an electrochemical etching method is provided to prevent the contamination of a device by excluding anisotropic etching solution.;CONSTITUTION: An etching mask is patterned on the surface of a silicon substrate. The surface of the silicon substrate is electrochemically etched. The electrochemical etching forms an etching area by applying an electric field having a first current density. The etching area includes micro openings. The etching area is etched by applying an electric field having a second current density higher than the first current density.;COPYRIGHT KIPO 2013;[Reference numerals] (AA) Initial washing; (BB) Photolithography; (CC) BOE(natural oxide film removal); (DD) Al deposition; (EE) Electrochemical etching(first current density); (FF) Etching area; (GG) Micro opening; (HH) Electrochemical etching(second current density)
机译:目的:提供一种通过电化学刻蚀方法制造硅线阵列的方法,以通过排除各向异性刻蚀溶液来防止器件污染。;组成:在硅基板表面上构图刻蚀掩模。硅基板的表面被电化学蚀刻。电化学蚀刻通过施加具有第一电流密度的电场来形成蚀刻区域。蚀刻区域包括微开口。通过施加具有比第一电流密度高的第二电流密度的电场来蚀刻蚀刻区域。; COPYRIGHT KIPO 2013; [参考数字](AA)初始清洗; (BB)光刻; (CC)BOE(自然氧化膜去除); (DD)铝沉积; (EE)电化学蚀刻(第一电流密度); (FF)蚀刻区域; (GG)微型开口; (HH)电化学蚀刻(第二电流密度)

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