TESTING CIRCUIT AND A TESTING METHOD OF A SEMICONDUCTOR INTEGRATED CIRCUIT CAPABLE OF ACCURATELY TESTING A DEGRADED CHIP

摘要

PURPOSE: A testing circuit and a testing method of a semiconductor integrated circuit are provided to reduce manufacturing costs and to improve manufacturing yield rate by testing a penetration via formed on a single chip and selecting a degraded chip before packaging.;CONSTITUTION: A testing circuit(1) of a semiconductor IC(integrated circuit) comprises a penetration via(100), a voltage driving part(200), and a determining part(300). The penetration via receives input voltage. The voltage driving part is connected to the penetration via and receives the input voltage. The voltage driving part responds a test control signal and changes the level of the input voltage and creates test voltage. The determining part outputs a result signal by comparing the input voltage with the test voltage.;COPYRIGHT KIPO 2013;[Reference numerals] (210) Pull-up part; (220) Pull-down part; (300) Determining part; (400) Buffer part; (500) Output part