Device for determining service life of electronic structure e.g. electrical converter, has computing unit computing service life of electronic structure from determined temperature and electrical size of electronic structure

摘要

The device has measuring units (14-17) for determining temperature in a region of an electronic structure (10) during operation of the electronic structure. A detection unit detects electrical size of the electronic structure during operation of the electronic structure. A computing unit computes service life of the electronic structure from the determined temperature and the electrical size. A memory unit stores service life curves, which reproduce a connection between level of temperature changes and expected amount of temperature changes to failure of the electronic structure. An independent claim is also included for a method for determining service life of an electronic structure.