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Method for correction of Raman-spectroscopic data in surface enhanced Raman spectroscopy chip in e.g. analytic research, involves performing intensity normalization of Raman spectrum in addition to wave number correction of Raman spectrum
Method for correction of Raman-spectroscopic data in surface enhanced Raman spectroscopy chip in e.g. analytic research, involves performing intensity normalization of Raman spectrum in addition to wave number correction of Raman spectrum
The method involves comparing carrier spectrum with a reference carrier spectrum of evaluation- or reference segments. A correction function is computed for Raman spectrum that is assigned to the carrier spectrum of evaluation- or reference segments by consideration of wave number difference. The Raman spectrum of the evaluation- or reference segment is pressurized. An intensity normalization of the Raman spectrum is performed by the evaluation segments in addition to wave number correction of the Raman spectrum of the evaluation- or reference segments followed by the correction function.
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