首页> 外国专利> METHOD FOR DEPOSITING NICKEL OR COBALT METAL LAYERS ON A SOLID SEMICONDUCTOR SUBSTRATE; KIT FOR IMPLEMENTING THIS METHOD

METHOD FOR DEPOSITING NICKEL OR COBALT METAL LAYERS ON A SOLID SEMICONDUCTOR SUBSTRATE; KIT FOR IMPLEMENTING THIS METHOD

机译:在固态半导体基体上沉积镍或钴金属层的方法;实施此方法的工具包

摘要

The present invention relates to a kit for the deposition of nickel or cobalt in the cavities of a semiconductor substrate such as vias through (TSV) for the realization of interconnections in integrated circuits in three dimensions. The invention also relates to a metallization process of the insulating surface of such a substrate which comprises contacting the surface with a liquid aqueous solution containing: at least one metal salt of nickel or coba at least one reducing agent; at least one polymer having amine functional groups, and at least one metal ion stabilizing agent; The conformity index of the nickel or cobalt layer obtained may be greater than 75%, which facilitates the subsequent filling of the vias with copper by electroplating.
机译:本发明涉及一种用于在诸如通孔(TSV)之类的半导体衬底的空腔中淀积镍或钴的工具包,以实现集成电路的三维互连。本发明还涉及这种衬底的绝缘表面的金属化方法,该方法包括使该表面与包含至少一种镍或钴的金属盐;和至少一种金属盐的液态水溶液接触。至少一种还原剂;至少一种具有胺官能团的聚合物和至少一种金属离子稳定剂;所获得的镍或钴层的一致性指数可以大于75%,这有助于随后通过电镀将通孔填充铜。

著录项

  • 公开/公告号FR2974818A1

    专利类型

  • 公开/公告日2012-11-09

    原文格式PDF

  • 申请/专利权人 ALCHIMER;

    申请/专利号FR20110053843

  • 发明设计人 VINCENT MEVELLEC;DOMINIQUE SUHR;

    申请日2011-05-05

  • 分类号C23C18/34;C25D3/38;C25D5/02;H01L21/3205;

  • 国家 FR

  • 入库时间 2022-08-21 17:03:56

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