首页> 外国专利> DYNAMIC LIGHT SCATTERING MEASURING METHOD AND DYNAMIC LIGHT SCATTERING MEASURING DEVICE EMPLOYING LOW COHERENCE LIGHT SOURCE

DYNAMIC LIGHT SCATTERING MEASURING METHOD AND DYNAMIC LIGHT SCATTERING MEASURING DEVICE EMPLOYING LOW COHERENCE LIGHT SOURCE

机译:采用低相干光源的动态光散射测量方法及动态光散射测量装置

摘要

PROBLEM TO BE SOLVED: To provide a dynamic light scattering measuring method employing a low coherence light source with which an average particle size of fine particles or the distribution thereof can be measured with high accuracy and through simple operation even in the case of a dispersion solution containing fine particles in high concentration, and a dynamic light scattering measuring device.SOLUTION: A dynamic light scattering measuring method is provided for measuring dynamic characteristics of fine particles Sdispersed in a dispersion solution S while using a Mach-Zehnder interferometer using low coherence light. According to the dynamic light scattering measuring method, in the dispersion solution S, the fine particles Sare irradiated with low coherence light, light scattered by the fine particles Sin the dispersion solution S is received for each of a plurality of different scattering angles as scattered light, and a translation/diffusion mode is selected and determined from a temporal correlation function of scattered light at each scattering angle .
机译:解决的问题:提供一种使用低相干光源的动态光散射测量方法,利用该方法,即使在分散液的情况下,也可以高精度且通过简单的操作来测量微粒的平均粒径或其分布。解决方案:提供了一种动态光散射测量方法,该方法用于使用低相干光的Mach-Zehnder干涉仪测量分散在分散液S中的微粒的动态特性。根据动态光散射测量方法,在分散溶液S中,细颗粒S被低相干光照射,对于多个不同的散射角中的每一个,接收由分散溶液S中的细颗粒S散射的光作为散射光。然后,根据每个散射角的散射光的时间相关函数选择并确定平移/扩散模式。

著录项

  • 公开/公告号JP2013205145A

    专利类型

  • 公开/公告日2013-10-07

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORP;

    申请/专利号JP20120072934

  • 申请日2012-03-28

  • 分类号G01N15/02;G01N21/27;

  • 国家 JP

  • 入库时间 2022-08-21 17:02:09

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