CRYSTAL PHASE QUANTITATIVE METHOD USING X-RAY DIFFRACTION

摘要

PROBLEM TO BE SOLVED: To simply measure a content of a substance composing a material by using an X-ray diffraction method.;SOLUTION: First of all, X-ray diffraction intensities I_si of respective crystalline phases in a reference sample in which contents of a plurality of crystalline phases are known are measured as reference intensities (step S1). Then X-ray diffraction intensities I_i of respective crystalline phases in a sample to be quantitated are measured as quantitative intensities (step S2). Then a value obtained by dividing the quantitative intensity I_i of each crystalline phase by the reference intensity I_si of each crystalline phase and multiplying the divided value of each crystalline phase by a mass ratio W_si of each crystalline phase in the reference sample is calculated as an index value of each crystalline phase and a value obtained by dividing the index value of each crystalline phase by the sum of index values of all the crystalline phases is simultaneously calculated as the content of each crystalline phase in the sample to be quantitated (step S3).;COPYRIGHT: (C)2013,JPO&INPIT