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Plating current density distribution measuring apparatus and plating current density distribution measurement method

机译:电镀电流密度分布测定装置及电镀电流密度分布测定方法

摘要

To provide a means to achieve a precise measurement of the in-plane distribution of the plating current density at the cathode plate. At least partially disposed below the liquid surface of the plating solution contained in a plating tank, an anode and plated members; A plating bath is formed in the first insulator and the one on the surface with a first measuring electrode which is a first current measuring body the first insulator is disposed to face the part of the surface of the plating of the plated member is subjected; plating power source; Plating The first wire connects the anode terminal and the anode of the power source electrically; second wiring electrically connecting the cathode terminal and the plated member plating power source; plating power source cathode terminal, a first first current disposed and the third wiring; of the measuring electrode, and the first measuring electrode and the plated member has a third wire for electrically connecting to form a parallel relationship plating current density distribution measuring apparatus comprising a measuring means. [Selection Figure] Figure 1
机译:提供一种手段,可以精确测量阴极板上电镀电流密度的面内分布。至少部分地设置在容纳在镀槽,阳极和镀构件中的镀液的液面下方。在第一绝缘体上形成镀浴,并且在其表面上具有第一测量电极,该第一测量电极是第一电流测量体,第一绝缘体被布置成面对被镀覆构件的镀敷表面的一部分;电镀电源;电镀第一根导线电气连接电源的阳极端子和阳极;第二布线将阴极端子和镀覆部件镀覆电源电连接。电镀电源的阴极端子,设置的第一第一电流和第三布线;所述第一测量电极和所述镀覆构件具有用于电连接以形成包括测量装置的平行关系的电镀电流密度分布测量装置的第三导线。 [选型图]图1

著录项

  • 公开/公告号JP5124756B1

    专利类型

  • 公开/公告日2013-01-23

    原文格式PDF

  • 申请/专利权人 ユケン工業株式会社;

    申请/专利号JP20110195666

  • 发明设计人 菊池 義治;

    申请日2011-09-08

  • 分类号C25D21/12;

  • 国家 JP

  • 入库时间 2022-08-21 16:55:37

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