首页> 外国专利> The optical lighting section which irradiates the focusing adjustment mannered null exposure light in the exposure device

The optical lighting section which irradiates the focusing adjustment mannered null exposure light in the exposure device

机译:在曝光装置中照射聚焦调整后的空曝光光的光学照明部

摘要

PROBLEM TO BE SOLVED: To adjust focus during exposure processing, and to adjust focus in a short time without adding an illuminating means and image receiving means dedicated to focus adjustment.;SOLUTION: This exposure apparatus of a belt-like workpiece projects a pattern formed in a mask M to the belt-like workpiece W to be exposed. A focus adjustment pattern FP for a projector lens is formed inside an alignment mark MAM of the mask M. A light transmitting member 10b is arranged in a through hole of a work stage 10 or on a notch 10a, and a focus adjustment pattern AP for an alignment microscope is formed. Alignment marks of the mask and the belt-like workpiece are detected by the alignment microscope 12, the mask M and the belt-like workpiece W are positioned. The focus adjustment pattern FP for the projector lens and the focus adjustment pattern AP for the alignment microscope are detected, and the focus adjustment is performed by the alignment microscope 12.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:在曝光处理期间调节焦点,并且在短时间内调节焦点,而无需添加专用于焦点调节的照明装置和图像接收装置。解决方案:该带状工件的曝光装置投影形成的图案在掩模M中将带状工件W露出。在掩模M的对准标记MAM内形成用于投影仪镜头的聚焦调节图案FP。在工作台10的通孔中或在凹口10a上布置有透光构件10b,并且,用于聚焦透镜的聚焦调节图案AP形成对准显微镜。掩模和带状工件的对准标记由对准显微镜12检测,掩模M和带状工件W被定位。检测用于投影仪镜头的焦点调节图案FP和用于对准显微镜的焦点调节图案AP,并通过对准显微镜12进行焦点调节; COPYRIGHT:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP5104107B2

    专利类型

  • 公开/公告日2012-12-19

    原文格式PDF

  • 申请/专利权人 ウシオ電機株式会社;

    申请/专利号JP20070201666

  • 发明设计人 柴田 清孝;

    申请日2007-08-02

  • 分类号G03F7/207;H01L21/60;H05K3/00;

  • 国家 JP

  • 入库时间 2022-08-21 16:54:57

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