首页> 外国专利> The approach place exposure device, approach place exposure method and formation method of resist pattern, the mask basic material which

The approach place exposure device, approach place exposure method and formation method of resist pattern, the mask basic material which

机译:接近放置曝光装置,接近放置曝光方法和抗蚀剂图案的形成方法,掩模基材

摘要

PROBLEM TO BE SOLVED: To provide a near-field exposure mask capable of ensuring intimate contact between the mask and an object to be exposed in a large area by a simple mechanism even when waving is present in the object substrate to be exposed, and to provide a near-field exposure apparatus and a near-field exposure method.;SOLUTION: The near-field exposure mask includes a light blocking film 102 having an opening 103 smaller than a wavelength of exposure light, and a mask base material 101 holding the light blocking film, and is configured and positioned to effect exposure of an object to be exposed to near-field light generated corresponding to the opening during contact thereof with the object to be exposed. The mask base material comprises a synthetic resin material transparent to the exposure light and having Young's modulus in a range from 1 GPa to 10 GPa.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种近场曝光掩模,即使在要曝光的对象基板中存在起伏的情况下,也能够通过简单的机构确保该掩模与要大面积曝光的对象之间的紧密接触。提供一种近场曝光设备和近场曝光方法。解决方案:近场曝光掩模包括:遮光膜102,其开口103小于曝光光的波长;以及掩模基材101,其保持所述开口的波长小于曝光波长。遮光膜,其被配置和定位成在将要曝光的物体与要曝光的物体接触期间,使要曝光的物体曝光于对应于该开口而产生的近场光。掩模基材包括对曝光光透明并且杨氏模量在1 GPa至10 GPa范围内的合成树脂材料。版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP5147328B2

    专利类型

  • 公开/公告日2013-02-20

    原文格式PDF

  • 申请/专利权人 キヤノン株式会社;

    申请/专利号JP20070208354

  • 发明设计人 水谷 夏彦;山口 貴子;伊藤 俊樹;

    申请日2007-08-09

  • 分类号G03F1/60;G03F1/00;H01L21/027;G03F7/20;

  • 国家 JP

  • 入库时间 2022-08-21 16:54:58

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