首页> 外国专利> Being provided in the analytical instrument null wire, and the wire support component and the aforementioned

Being provided in the analytical instrument null wire, and the wire support component and the aforementioned

机译:被提供在分析仪器中的空导线,导线支撑部件和前述

摘要

PROBLEM TO BE SOLVED: To collect trace foreign bodies of several micrometers that cause defects in devices, and the like, and perform mass spectrometry that is free of contaminants and satisfactory in the S/N.;SOLUTION: A trace sample heating probe includes a sample-holding section constituted of two members, having different diameters, a support section and a terminal section. The sample-holding section, having a heating mechanism in a small portion thereof, is such that only an area of the sample-holding section that is very close to a trace sample to be analyzed is heated. Hence, even if the probe has contaminants adhering thereto, these contaminants will not be heated so that noise is not generated. This enables analyses that are quite satisfactory in the S/N.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:收集会导致设备等缺陷的几微米的痕量异物,并进行无杂质且信噪比令人满意的质谱分析;解决方案:痕量样品加热探针包括一个样品保持部由直径不同的两个部件,支撑部和末端部构成。样品保持部的一小部分具有加热机构,使得仅加热样品保持部的非常接近要分析的痕量样品的区域。因此,即使探针上附着有污染物,这些污染物也不会被加热,因此不会产生噪音。这使得在S / N中令人满意的分析成为可能。;版权所有:(C)2009,JPO&INPIT

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