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The defective survey instrument, being the defective survey instrument which measures, the position

机译:缺陷检验仪器,是测量位置的缺陷检验仪器

摘要

PPROBLEM TO BE SOLVED: To measure the position of a defect by a device of a simple structure dispensing with the positioning of two cameras or calibration when measuring the thickness-wise position of the defect in a transparent plate-like body. PSOLUTION: This defect inspecting device includes a camera, and a half mirror provided between the plate-like body and the camera. This allows images of the defect to be taken by means of the camera through two sight lines of different angles. The position of the defect is calculated based on a displacement amount between the images of the defect taken through the two sight lines. PCOPYRIGHT: (C)2009,JPO&INPIT
机译:

要解决的问题:当在透明板状体中测量缺陷的厚度方向位置时,通过一种结构简单的设备来测量缺陷位置,省去了两个摄像机的位置或校准。

解决方案:该缺陷检查设备包括一个摄像头,以及一个位于板状体和摄像头之间的半反射镜。这允许缺陷的图像借助于照相机通过两个不同角度的视线来拍摄。基于通过两条视线拍摄的缺陷图像之间的位移量来计算缺陷的位置。

版权:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP5157471B2

    专利类型

  • 公开/公告日2013-03-06

    原文格式PDF

  • 申请/专利权人 旭硝子株式会社;

    申请/专利号JP20080011811

  • 发明设计人 楜澤 信;

    申请日2008-01-22

  • 分类号G01N21/896;

  • 国家 JP

  • 入库时间 2022-08-21 16:53:24

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