POWER DROOP REDUCTION VIA CLOCK-GATING FOR AT-SPEED SCAN TESTING

摘要

A clock gating mechanism controls power within an integrated circuit device. One or more clock gating circuits are configured to couple a system clock to a different portion of the integrated circuit device. A logic circuit applies an enabling signal to one of the clock gating circuits to control whether the system clock passes through the clock gating circuit to a portion of the integrated circuit device associated with the clock gating circuit. A plurality of scan flip-flops is configured to provide a binary code to the logic circuit, where the binary code indicates to the logic circuit that the enabling signal should be applied to the clock gating circuit. One advantage of the disclosed technique is that power droop during at-speed testing of a device is reduced without significantly increasing the quantity of test vectors or reducing test coverage, resulting in greater test yields and lower test times.