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IIMPLEMENTING ENHANCED APERTURE FUNCTION CALIBRATION FOR LOGIC BUILT IN SELF TEST (LBIST)
IIMPLEMENTING ENHANCED APERTURE FUNCTION CALIBRATION FOR LOGIC BUILT IN SELF TEST (LBIST)
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机译:自我测试中逻辑构建的增强光圈功能校准的实现(LBIST)
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摘要
A method and circuits for implementing aperture function calibration for Logic Built In Self Test (LBIST) diagnostics, and a design structure on which the subject circuit resides are provided. The aperture function calibration uses aperture calibration data, and an LBIST calibration channel having a predefined number of scan inversions between the aperture calibration data and a multiple input signature register (MISR). LBIST is run selecting the LBIST calibration channel and masking other LBIST channels to the MISR. A change in the MISR value, for example, from zero to a non-zero value, is identified and an aperture adjustment is calculated and used to identify any needed adjustment of aperture edges.
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